深圳市锐测电子科技有限公司 刘华周
Wafer & Substrate Probe Stations & Accessories
For 4”, 6”, 8” and 12” wafer
·Stable probe station can reduce expendables used and prevent wafer scraped
·Failure Analysis, Reliability, Device characterization, Wafer Acceptance Test, Quality Assurance
and general purpose probing
·Five levels configurations to choose from Manual, Motorized, Joystick programmable, Software prog rammable and Semi-Automatic.
·Can upgrade when you need, and just upgrade in your LAB
·High performance thermal chuck system. The fastest transition times in the industry
·Coolant temperature never exceeds 20°C. Temperature ranges as high as 600°C
·Board mount chuck for mount various boards with test sockets
·Deep Sub-micron, Resolution Probe Positioner 800 TPI